User Contributed CAL. LAB. PROCEDURE ============================================================================= INSTRUMENT: HP 3457A DMM DC W/IEEE,(MAIN) PERFORMANCE TEST DATE: 17-Mar-95 AUTHOR: User Contributed REVISION: ILCM-12-295-CU2-B ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 29 NUMBER OF LINES: 191 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 HEAD {*************** DC VOLTAGE TESTS ***************} 1.002 ASK- R N P M F W 1.003 DISP Turn off the UUT and connect the IEEE-488 port 1.003 DISP on the rear of the UUT to the second IEEE-488 port 1.003 DISP of the controller using an IEEE-488 cable. 1.003 DISP Turn on the UUT again. 1.004 MMFC C2 1.005 DISP Connect the UUT to the 5700A as follows: 1.005 DISP | 5700A UUT 1.005 DISP | OUTPUT HI INPUT HI 1.005 DISP | OUTPUT LO INPUT LO 1.005 DISP | SENSE V/OHMS HI SENSE HI 1.005 DISP | SENSE V/OHMS LO SENSE LO 1.005 DISP | CURRENT OUTPUT HI CURRENT INPUT I 1.006 HEAD {****** DC VOLTS OFFSET TEST ******} 1.007 IEEE [TERM LF] 1.008 IEEE DCV 300 1.009 5700 0V S 2W 1.010 IEEE RESET 1.010 IEEE TRIG HOLD 1.011 IEEE NDIG 6 1.011 IEEE TIMER 2 1.011 IEEE NRDGS 3 1.012 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 1.013 MEME 1.014 MEMC 300 V 0.0007U 2.001 IEEE DCV 30 2.002 5700 0V S 2W 2.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 2.004 MEME 2.005 MEMC 30 V 0.0002U 3.001 IEEE DCV 3 3.002 5700 0V S 2W 3.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 3.004 MEME 3.005 MEMC 3 V 0.000007U 4.001 IEEE DCV .3 4.002 5700 0V S 2W 4.003 HEAD {****** DC MILLIVOLTS OFFSET TEST ******} 4.004 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 4.005 MEM* 1 4.006 MEME 4.007 MEMC 300 mV 0.000004U 5.001 IEEE DCV .03 5.002 5700 0V S 2W 5.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 5.004 MEM* 1 5.005 MEME 5.006 MEMC 30 mV 0.00000385U 6.001 HEAD {****** DC VOLTS GAIN TEST ******} 6.002 IEEE DCV .03 6.003 5700 30.000mV S 2W 6.004 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 6.005 MEM* 1000 6.006 MEME 6.007 MEMC 0.03 mV 0.0052U 7.001 IEEE DCV .3 7.002 5700 300.000mV S 2W 7.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 7.004 MEM* 1000 7.005 MEME 7.006 MEMC 0.3 mV 0.0145U 8.001 IEEE DCV 3 8.002 5700 3V S 2W 8.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 8.004 MEME 8.005 MEMC 3 V 0.000082U 9.001 IEEE DCV 30 9.002 5700 30V S 2W 9.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 9.004 MEME 9.005 MEMC 30 V 0.0014U 10.001 IEEE DCV 300 10.002 5700 300V S 2W 10.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 10.004 MEME 10.005 MEMC 300 V 0.0172U 11.001 HEAD {****** DC VOLTS LINEARITY TEST ******} 11.002 IEEE DCV 3 11.003 5700 3V S 2W 11.004 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 11.005 MEME 11.006 MEMC 3 V 0.000082U 12.001 5700 2V S 2W 12.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 12.003 MEME 12.004 MEMC 3 V 0.000057U 13.001 5700 1V S 2W 13.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 13.003 MEME 13.004 MEMC 3 V 0.000032U 14.001 5700 -1V S 2W 14.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 14.003 MEME 14.004 MEMC 3 V 0.000032U 15.001 5700 -2V S 2W 15.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 15.003 MEME 15.004 MEMC 3 V 0.000057U 16.001 5700 -3V S 2W 16.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 16.003 MEME 16.004 MEMC 3 V 0.000082U 17.001 HEAD 17.002 RSLT = 17.003 HEAD {************ DC CURRENT OFFSET TEST ************} 17.004 IEEE DCI .0003 17.005 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 17.006 MEM* 1000000 17.007 MEME 17.008 MEME 0 17.009 MEMC 300 uA 0.0104U 18.001 IEEE DCI .003 18.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 18.003 MEM* 1000 18.004 MEME 18.005 MEME 0 18.006 MEMC 3 mA 0.000104U 19.001 IEEE DCI .03 19.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 19.003 MEM* 1000 19.004 MEME 19.005 MEME 0 19.006 MEMC 30 mA 0.00104U 20.001 IEEE DCI .3 20.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 20.003 MEM* 1000 20.004 MEME 20.005 MEME 0 20.006 MEMC 300 mA 0.0204U 21.001 IEEE DCI 1.5 21.002 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 21.003 MEME 21.004 MEME 0 21.005 MEMC 1 A 0.000604U 22.001 HEAD {************ DC CURRENT GAIN TEST ************} 22.002 IEEE DCI .0003 22.003 5700 300uA S 2W 22.004 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 22.005 MEM* 1000000 22.006 MEME 22.007 MEMC 300 uA 0.1304U 23.001 IEEE DCI .003 23.002 5700 3mA S 2W 23.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 23.004 MEM* 1000 23.005 MEME 23.006 MEMC 3 mA 0.001304U 24.001 IEEE DCI .03 24.002 5700 30mA S 2W 24.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 24.004 MEM* 1000 24.005 MEME 24.006 MEMC 30 mA 0.01304U 25.001 IEEE DCI .3 25.002 5700 300mA S 2W 25.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 25.004 MEM* 1000 25.005 MEME 25.006 MEMC 300 mA 0.2604U 26.001 IEEE DCI 1.5 26.002 5700 1A S 2W 26.003 IEEE [D1000] [TRIG] [I] [D1000] [TRIG] [I] 26.004 MEME 26.005 MEMC 1 A 0.001304U 27.001 HEAD 27.002 RSLT = 27.003 JMP 28.001 27.004 EVAL dummy line 28.001 CALL HP 3457A DMM AC VOLT/CURR/FREQ. SUB-PROCEDURE 28.002 JMP 29.001 28.003 EVAL dummy line 29.001 CALL HP 3457A DMM OHMS SUB-PROCEDURE 29.002 DISP This completes the verification for the HP 3457A. 29.003 END # # PROGRAM NOTES: REV. B added delay and another trigger command to all # the test lines because the procedure was failing to # work with the NEW & FASTER COMPUTER.